An 8-bit pixel processing core designed for electron beam inspection systems. This module processes pixel data in real-time, performing defect detection through multiple algorithms including running mean calculation, local contrast analysis, and edge detection.
The core accepts 8-bit pixel values on the ui_in inputs, synchronized with a pix_valid signal on uio_in[0]. It maintains a running mean using an Infinite Impulse Response (IIR) filter to track local brightness levels.
Key features:
uio_in[2]uio_in[3]uio_in[4]uio_out[5]Configurable registers:
The uo_out provides:
uo_out[7]: defect_any - Any defect condition detecteduo_out[6]: bright_defect - Pixel significantly brighter than local meanuo_out[5]: dark_defect - Pixel significantly darker than local meanuo_out[4]: edge_strong - Strong edge detecteduo_out[3:0]: mag_nib - 4-bit magnitude of the strongest detected featureui_in[7:0]pix_valid on uio_in[0] when pixel data is validframe_start on uio_in[1] to reset frame-based processing if neededuo_out[7:0]This is a digital processing core designed for integration into larger inspection systems. No external hardware required for basic operation.
| # | Input | Output | Bidirectional |
|---|---|---|---|
| 0 | pixel[0] | mag[0] | pix_valid |
| 1 | pixel[1] | mag[1] | frame_start |
| 2 | pixel[2] | mag[2] | spi_cs_n |
| 3 | pixel[3] | mag[3] | spi_sclk |
| 4 | pixel[4] | edge_strong | spi_mosi |
| 5 | pixel[5] | dark_defect | spi_miso |
| 6 | pixel[6] | bright_defect | |
| 7 | pixel[7] | defect_any |
| # | Input | Output | Bidirectional |
|---|---|---|---|
| 0 | pixel[0] | mag[0] | pix_valid |
| 1 | pixel[1] | mag[1] | frame_start |
| 2 | pixel[2] | mag[2] | spi_cs_n |
| 3 | pixel[3] | mag[3] | spi_sclk |
| 4 | pixel[4] | edge_strong | spi_mosi |
| 5 | pixel[5] | dark_defect | spi_miso |
| 6 | pixel[6] | bright_defect | |
| 7 | pixel[7] | defect_any |